{"id":4048,"date":"2026-02-27T16:11:50","date_gmt":"2026-02-27T16:11:50","guid":{"rendered":"https:\/\/rqmem.recherche.usherbrooke.ca\/?post_type=equipement&p=4048"},"modified":"2026-08-03T19:15:46","modified_gmt":"2026-08-03T19:15:46","slug":"scios-sem-fib","status":"publish","type":"equipement","link":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/equipement\/scios-sem-fib\/","title":{"rendered":"SCIOS 2 dualbeam FIB-SEM"},"content":{"rendered":"
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\n\t\tNode <\/strong>:\t<\/p>\n\n\n\n

\"universit\u00e9<\/figure>\n\n<\/div>\n\n\n
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Manufacturer and model : <\/strong>ThermoFisher SCIOS 2 Dualbeam FIB-SEM<\/p>\n\n\n\n

External website<\/strong> : 3iT materials<\/a> <\/p>\n\n\n\n

Contact person<\/strong> : Fr\u00e9d\u00e9ric Voisard<\/a><\/p>\n\n\n\n

Part of RQM\u00c9M<\/strong> : yes<\/p>\n\n\n\n

Address<\/strong> 3000, University Blvd, Sherbrooke, QC J1K 0A5<\/p>\n\n<\/div>\n\n\n

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Versatile and high performing for material science, engineering, semiconductor failure analysis and quality control. Dual beam electron microscope combining scanning electron microscopy (SEM) and focalized ion beam (FIB). <\/p>\n\n\n\n

Detectors, cameras and spectrometers :<\/strong><\/p>\n\n\n\n

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  • \n\t\n\n

    Secondary electrons and filtered secondary electrons (in lens<\/em>)<\/p>\n\n<\/li>\n\n\n\n

  • \n\t\n\n

    Backscattered electrons<\/p>\n\n<\/li>\n\n\n\n

  • \n\t\n\n

    Segmented transmission annular<\/p>\n\n<\/li>\n\n\n\n

  • \n\t\n\n

    X Ray Spectroscopy<\/p>\n\n<\/li>\n\n<\/ul>\n\n\n\n

    Specifications :<\/strong><\/p>\n\n\n\n

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    • \n\t\n\n

      FEG Schottky Canon<\/p>\n\n<\/li>\n\n<\/ul>\n\n\n\n

      Applications <\/strong>:<\/p>\n\n\n\n

      E-T, surface, topology, composition contrast, thin films, cartography<\/p>\n\n\n\n

      Performing for sample preparation and three dimension subsurface characterization of a wide variety of samples. Adapted for magnetic and non-conductive samples. <\/p>\n\n\n\n

      High resolution imagery and high voltage milling as well as good low voltage performances, allowing the preparation of high quality lamellae for transmission electron microscopes. <\/p>\n\n\n\n

      Backscattered electron detector (BSE) allows for better contrast material imaging.<\/p>\n\n\n\n

      Adapted for academic, industrial and governmental research. <\/p>\n\n<\/div>\n\n<\/div>\n\n\n\n

      <\/p>","protected":false},"featured_media":0,"template":"","meta":{"_uag_custom_page_level_css":"","site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}}},"class_list":["post-4048","equipement","type-equipement","status-publish","hentry"],"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"trp-custom-language-flag":false},"uagb_author_info":{"display_name":"admin","author_link":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/author\/"},"uagb_comment_info":0,"uagb_excerpt":null,"_links":{"self":[{"href":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/wp-json\/wp\/v2\/equipement\/4048","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/wp-json\/wp\/v2\/equipement"}],"about":[{"href":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/wp-json\/wp\/v2\/types\/equipement"}],"wp:attachment":[{"href":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/wp-json\/wp\/v2\/media?parent=4048"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}