{"id":4542,"date":"2026-04-21T14:15:18","date_gmt":"2026-04-21T14:15:18","guid":{"rendered":"https:\/\/rqmem.recherche.usherbrooke.ca\/?post_type=equipement&p=4542"},"modified":"2026-08-03T18:38:20","modified_gmt":"2026-08-03T18:38:20","slug":"flat-and-cross-section-ion-milling","status":"publish","type":"equipement","link":"https:\/\/rqmem.recherche.usherbrooke.ca\/en\/equipement\/flat-and-cross-section-ion-milling\/","title":{"rendered":"Flat and Cross section Ion Milling"},"content":{"rendered":"
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\n\t\tNode <\/strong>:\t<\/p>\n\n\n\n

\"mcgill<\/figure>\n\n\n\n

Universit\u00e9 McGill – McGill Electron Microscopy Research Group<\/p>\n\n<\/div>\n\n\n

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Manufacturer and model : <\/strong>Hitachi IM-4000 Plus<\/p>\n\n\n\n

External website<\/strong> : McGill<\/a><\/p>\n\n\n\n

Contact person<\/strong> : Nicolas Brodusch<\/a>; St\u00e9phanie Bessette<\/a>; Lise Guichaoua<\/a><\/p>\n\n\n\n

Part of RQM\u00c9M<\/strong> : no<\/p>\n\n\n\n

Address<\/strong> M.H. Wong Building, 3610, University Street, Montreal, QC H3A 0C5<\/p>\n\n<\/div>\n\n\n

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Flat and cross section ion milling <\/p>\n\n\n\n

Specifications :<\/strong><\/p>\n\n\n\n

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  • \n\t\n\n

    It has optical systems to ensure perfect milling of surfaces <\/p>\n\n<\/li>\n\n\n\n

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    its range of acc.voltages from 1 to 6 kV<\/p>\n\n<\/li>\n\n\n\n

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    Different modes of stage rotation<\/p>\n\n<\/li>\n\n\n\n

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    Air protection transfer system<\/p>\n\n<\/li>\n\n<\/ul>\n\n\n\n

    Applications <\/strong>:<\/p>\n\n\n\n

    M-4000PLus is a broad ion milling system used for cross-sectioning and flat milling of various materials. Milling is not limited to hard materials, but can also be used on materials like paper, polymers or powders. Sample prepration before SEM analysis. <\/p>\n\n\n\n

    As well as its use for sample preparation for electron microscopes, Ion milling can also be used to prepare samples for atomic force microscopy (AFM). This system uses a low energy Ar+ ion beam to produce a larger milling without distortions and without applying any mechanical stress. The instrument offers two configurations : cross-section cutting of samples and wide-area sample surface fine polishing. <\/p>\n\n<\/div>\n\n<\/div>\n\n\n\n

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