Node :
Université Concordia – Concordia Materials Characterization Platform
Manufacturer and model : Microscope électronique à balayage Hitachi Regulus 8230
External website : Concordia Materials Characterization Platform
Contact person : Dmytro Kevorkov
Part of RQMÉM : yes
Address : 1455, Maisonneuve W Blvd, Montreal, QC H3G 1M8
Resolution :
5 nm
Detectors, cameras and spectrometers :
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Secondary electrons (SE)
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Backscattered electrons (BSE)
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Energy dispersive spectroscopy (EDS)
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Electron backscatter diffraction (EBSD)
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Scanning Transmission Electron Microscopy (STEM)
Applications :
High resolution scanning electron microscope, with cold field emission source, ideal for ultra high resolution. Sample size going up to 150 mm. Specialized with structural and chemical characteristics of materials, including metals, alloys, semiconductors, composites, etc. Ideal for academic or industrial applications in material sciences.
To reserve time on the machine, contact Mazen Samara and Dmytro Kevorkov.
The platform is equipped with a variety of additional equipments for material characterization including a metallographic optical microscope (MOM), a laser confocal microscope, a thermogravimetric analyzer (TGA), a differential scanning calorimeter (DSC), a X-Ray diffractometer (XRD) with micro-XRD, a water droplet erosion (WDE) tester, a thermal conductivity analyzer, a rotating beam fatigue testing machine, an Oxygen/Nitrogen/Hydrogen Analyzer, a Carbon/Sulfur analyzer, and many more specialized equipments.