Microscope Hitachi SU-8230 CFE-SEM/STEM

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Université McGill – McGill Electron Microscopy Research Group

Manufacturer and model : Microscope Hitachi SU-8230 CFE-SEM/STEM

External website : McGill

Contact person : Nicolas Brodusch; Lise Guichaoua

Part of RQMÉM : no

Address M.H. Wong Building, 3610, University Street, Montreal, QC H3A 0C5

Resolution : 0.4 nm at 30 kV, 3 nm at 0.05 kV

Detectors, cameras and spectrometers :

  • SE Detector in chamber

  • SE/BSE detector in lens with energy filter (upper and top)

  • Solid-state photodiode BSE detector (5 quadrants)

  • Détecteur BF STEN avec ouvertures

  • STEM BF detector with aperturesSolid-state ADF/HAADF detector with ajustable collection angles

  • Bruker XFlash 6|60 60mm2 SDD2

  • 4 quadrants Bruker FlatQuad 5060F SDD (1.2 Sr)

  • Bruker eFlash EBSD camera with ARGUS and OPTIMUS detectors

  • Downstream eCloud in situ cleaning

Specifications :

  • Cold field emission / émission à froid

Applications :

Allows to catpture incredible surface details and work in STEM mode on thin sample. Its moderated auto-flash fonction promises an optimal brightness at all times, offering high spatial resolution and better noise/signal ratio in imagery mode, as well as a higher X-ray generation rate.

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