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Polytechnique Montréal – Centre de caractérisation microscopique des matériaux (CM)2
Manufacturer and model : Thermo Fisher Scientific Double faisceau Helios Hydra CX
External website : (CM)2
Contact person : Jean-Philippe Masse
Part of RQMÉM : yes
Address : Main building (A), 2900, Édouard-Montpetit Blvd, Montreal, QC H3T 1J4
Microscope électronique à faisceau ionique focalisé (FIB)
Resolution :
0.6 nm at 15 kV
Detectors, cameras and spectrometers :
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Secondary electrons (SE)
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Backscattered electrons (BSE)
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Low Angle Back Scattered Electrons (LABE)
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Scanning Transmission Electron Microscopy with high angle annular dark field (STEM/HAADF)
Specifications :
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System for deposition of tungsten, platinum and carbon by electron or ion beam (MultiChem)
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Four ion species to choose from (Xe, Ar, O and N)
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Ionic column wiht high current
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Equipped with a micro-manipulator to place the sample on the standard MET sample-holder
Applications :
Micro-usinage de grande surface/volumes, reconstruction multimodale 3D par coupe en série (microstructure, cristallographie et chimie), préparation d’échantillons STEM, TEM et APT sans Ga+, système très polyvalent.
Many possible applications including volume electron microscopy, correlative light and electron microscopy, Spin Mill Bio method, lamellae preparation, high pressure freezing, cellular ultrastructure, network tomography.
